解决方案概述
Managing the Cost and Complexity of Integrated Devices, Modules, and Circuits
As devices, modules, and integrated circuits (ICs) become more highly integrated, the number of ports you must evaluate increases dramatically. In addition, emerging applications have more diverse measurement requirements that require both DC and dynamic measurements. To meet these demands, the number of precision power supply channels required for integrated device, module, and circuit characterization has increased significantly, necessitating the addition of new instrumentation, such as pulsers and digitizers. As a result, the space occupied by the test system and costs increase, setup and control become more complex, and the effort required to develop and maintain the test system rises.
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