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i3070 In-Circuit Test System Software
Experience enhanced testing capabilities with i3070 In-Circuit Test System Software
Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
Our software licenses include the following:
- Advanced Throughput Multiplier, which can save up to 50% of test time.
- Native testing software licenses for boundary scan-related tests that cover IEEE 1149.1 and 1149.6 standards.
- Keysight's Cover Extend Technology (CET) for extending test coverage to non-boundary scan devices using nanoVTEP and CET Signal Conditioner Card.
- Silicon Nails feature uses boundary scan device drivers and receivers to test non-boundary scan devices connected to the chain flashing test capability through Flash ISP and PLD ISP features.
- DGN Advanced Reporting feature for diagnostic testing.
- Yearly software updates for test development and runtime to keep your testing up-to-date.
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Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
Cover-Extend Technology (CET) extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
Software Update for testhead is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
边界扫描是一项在印刷电路板上进行互连测试的方法。 是德科技 Interconnect Plus 边界扫描功能可支持全部所需的工具，以便在被测电路板上规划并执行这项基础测试。
是德科技 1149.6 Interconnect Plus 边界扫描功能可支持全部所需的工具，以便在被测电路板上规划并执行这项测试。 与 1149.1 标准相比，1149.6 标准所定义的边界扫描测试主要面向设计有交流耦合信号或差分网络，以实现高速运行的设备。
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
先进吞吐量乘法器功能让您能够在 4 模块测试仪上同时测试多达两块 1000 至 2000 节点（1296 到 2592 个节点之间）电路板，将测试时间缩短一半。
覆盖扩展技术（CET）通过使用 VTEP 或 nanoVTEP 和 CET 信号调理卡硬件，将边界扫描有限接入解决方案扩展到非边界扫描器件上。
The Drive Thru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
“基本诊断”版本允许所有用户使用。用户可使用这个主要故障诊断工具查看硬件配置，验证和隔离硬件故障。 某些诊断测试要求系统上安装有引脚验证夹具。
用户还可以使用 Silicon Nails 测试开发工具自定义对不合规的边界扫描器件执行的矢量。 测试开发工具将会生成边界扫描测试，并在相关互连引脚上输出或输入，从而实现测试一致性。
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