How to Perform Flash Programming with In-Circuit Test (ICT) System

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i7090 Massively Parallel and Scalable In-Circuit Tester
+ In-Circuit Tester
i7090 Massively Parallel and Scalable In-Circuit Tester
+ In-Circuit Tester

Performing flash programming with an in-circuit tester

Performing flash programming with an in-circuit tester (ICT) requires integrating in-system programming (ISP) capabilities into the ICT platform. ISP enables microcontrollers, field-programmable gate arrays (FPGAs), and other programmable devices to be programmed directly on the assembled circuit board, eliminating the need for external programming stations and reducing handling steps. To enable this functionality, the ICT system must be equipped with the necessary hardware and software to support ISP protocols such as Joint Test Action Group (JTAG), Serial Peripheral Interface (SPI), or Universal Asynchronous Receiver-Transmitter (UART). This includes ensuring proper physical access via test probes or fixture pins, using compatible programming algorithms, and establishing reliable communication channels for data transfer and device configuration.

Successful integration also requires close collaboration between PCB design and test engineering teams. Proper test pad placement and electrical access must be planned during the design phase to allow the ICT to interface effectively with the target devices. Without this early coordination, ISP may not be viable in production. Additionally, validation steps must be included to confirm programming integrity—such as signal stability checks, voltage monitoring, and post-programming verification like checksum comparisons. When implemented correctly, ISP within an ICT setup streamlines manufacturing by combining testing and programming into one efficient, consolidated step.

In-system programming (ISP) solution for in-circuit tester (ICT)

Integrating flash programming into an ICT test system requires the necessary hardware interfaces and software tools to communicate with target devices. The Keysight i7090 and i3070 Series 7i test systems are designed to support this integration within in-circuit test (ICT) environments. These systems provide the hardware interfaces, such as fixture access and signal routing, as well as the software tools necessary for seamless communication with programmable devices. They support standard programming protocols, such as JTAG and SPI, ensuring compatibility with a wide range of microcontrollers, FPGAs, and flash memory. Additionally, they offer reliable programming algorithms and robust data transfer mechanisms that enhance the speed and stability of the flash programming process.
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